“Gen III” Piezoelectric PMN-PZT Single Crystal Sensors and Actuators for Structural Health Monitoring Application

HYUN-JAE JOO, MOON-CHAN KIM, HO-YONG LEE

Abstract


Crystallographically engineered Relaxor-PT single crystals, specifically PMN-PT (Generation I) and PIN-PMN-PT/PMN-PZT (Generation II), offer much higher piezoelectric and electromechanical coupling coefficients (d33 > 1,500 pC/N, k33 > 0.9), when compared to polycrystalline PZT ceramics. Recently Ceracomp Co., Ltd. (www.ceracomp.com) has developed the solid-state single crystal growth (SSCG) technique and successfully fabricated Gen III PMN-PZT single crystals modified with acceptors or donors [Fig. 1]. The piezoelectric constants (d33) of (001) Gen III PMN-PZT single crystals were measured to be higher than 4,000 pC/N and thus about two times higher than those of PMN-PT/PZN-PT (Gen I) and PIN-PMN-PT/PMN-PZT (Gen II) single crystals. The Gen III PMN-PZT single crystals have been firstly applied to single crystal-epoxy composites, ultrasonic transducers, piezoelectric sensors, and piezoelectric actuators [Fig. 2]. In this presentation, we will introduce the development of high performance piezoelectric sensors and actuators by using the Gen III PMN-PZT single crystals for SHM (structural health monitoring) application.


DOI
10.12783/shm2023/36983

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