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Impact Disrupted Gunshot Residue: a Sub Micron Analysis Using a Novel Collection Protocol
Abstract
In this experiment, silicon substrates were used to collect gunshot residue (GSR) fired from rim-fire ammunition were analysed under cold Filed Emission Gun Scanning Electron Microscope with an X-flash Energy Dispersive X-ray detector. This allowed for particle analysis throughout individual particles at great resolution. During this analysis, different populations of particles of an irregular and molten-looking morphology were discerned, indicating that particles upon impact, forming "impact disgruntled" GSR.
DOI
10.12783/ballistics2017/16872
10.12783/ballistics2017/16872